The AFM Probe Is The Most Crucial Component Of The AFM
At Nanodevice Solutions our expertise lies in the design and fabrication of specialty and regular AFM probes. Currently, our company batch manufactures two families of probes with unique characteristics; high aspect ratio (HAR) probes, and edge probes. Learn more about our products and available customization options below for each probe.
AFM High Aspect Ratio (HAR) Probes
Produces high-resolution images that are needed for samples with complex high aspect ratio structures that are narrow and deep or tall and dense.
AFM Edge Probes
Specifically designed to aid in finding the exact location of the tip on the desired area on the sample surface.