The AFM “sees” the sample surface with a special part known as the AFM tip. The AFM tip is brought close to the sample surface until it is, for most intents and purposes, touching the sample surface. Then, the AFM tip is scanned over the sample surface to produce a detailed topographical image. The tip must be replaced regularly to create good images. The shape and size of the tip will affect the image resolution, For the highest quality with the least distortion, a long and thin tip is required. We need high aspect ratio AFM tips to produce effective results.