AFM Edge Probes
Specially designed for easy tip detection and positioning on the sample surface
AFM edge probes have the tip located at the very end of the cantilever so users can easily see the tip from the top of the AFM’s camera display. This direct positioning capability will help the users to position the tip at a very close approximate location to the area that needs to be imaged. Additionally, the edge probe has an extremely sharp tip, with a tilted structure allowing the tip to scan the surface of the sample with the highest precision.
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Highlights of AFM Edge Probes
- Precise tip location can be determined based on where the cantilever backside is located
- Customization available for various tip shapes, coatings, and dimensions
- Affordable AFM tips that provide high-quality images
- Compatible with all AFM’s in the market
Note: Image above is for illustration purposes only
Property/Tip Edge R1 Tip Average Radius / r (nm) <10 Resonance Freq. (kHz) 300 ± 100 Force Constant (N/m) 37 ± 24 Tip Height / TH (µm) 15 ± 1 Tip Shape Half Pyramidal Tip Material C-Si Application Non-Contact / Tapping / Contact Cantilever Shape Rectangular Cantilever Length / L (µm) 125 ± 10 Cantilever Width / W (µm) 30 ± 5 Cantilever Thickness / T (µm) 4 ± 0.5 Cantilever Material Si Backside Coating None Frontside Coating None Chip Length / L_Chip (mm) 3.4 Chip Width / W_Chip (mm) 1.6 Thickness (mm) 0.3 Chip Material SOI
Note: images are for illustration purposes only