by Kevin Au | Apr 6, 2018 | News |
The AFM “sees” the sample surface with a special part known as the AFM tip. The AFM tip is brought close to the sample surface until it is, for most intents and purposes, touching the sample surface. Then, the AFM tip is scanned over the sample surface to produce a...
by Kevin Au | Apr 4, 2018 | News |
A group of researchers from China, led by Professor Han Zhang from Shenzhen University, Professor Xue-Feng Yu from the Chinese Academy of Science, and Professor Lei Liao from Wuhan University, reported a breakthrough in metal-ion-modified black phosphorus with...