High Aspect Ratio (HAR) Rocket Probes

AFM probe is the most crucial component of the AFM. High Aspect Ratio (HAR) probes provide a much clearer image than standard AFM tips where imaging of structures with small openings and deep features are desired. Due to the tilt compensation and geometry of our High Aspect Ratio Rocket tip, our tip can better reach smaller pits, and corners that the larger pyramid shape of the standard tip struggles to do. View below to see full details about the tips specifications and further customization options available.

Note: Images are for illustration purposes only

High-Aspect-Ratio-Tip-Sketch

Product
AFM Cantilever 1
AFM Tip Material
Silicon body/Polysilicon lever
AFM Cantilever Thickness ± 0.15 (µm)
3
AFM Cantilever Width ± 3 (µm)
34
AFM Cantilever Length ± 2 (µm)
93
Resonant Frequency ± 10% (kHz)
390
Force Constant ± 20% (N/m)
34
Product
AFM Cantilever 2
AFM Tip Material
Silicon body/Polysilicon lever
AFM Cantilever Thickness ± 0.15 (µm)
3
AFM Cantilever Width ± 3(µm)
34
AFM Cantilever Length ± 2 (µm)
123
Resonant Frequency ± 10% (kHz)
230
Force Constant ± 20% (N/m)
17
Product
AFM Tip Specifications
AFM Tip Material
Silicon
AFM Tip Height (µm)
9-16
Cone Angle
≤ 30°
Curvature Radius (nm)
< 10
Tilt Compensation Angle ± 2
10°
Coating
Metal
Back side
Tip
Surface treatment (hydrophobic or hydrophilic)
Dimensions
AFM Tip Height
AFM Tip Shape
AFM Cantilever Dimensions
afm-tip-customizations

Note: images are for illustration purposes only