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The AFM Probe Is The Most Crucial Component Of The AFM

At Nanodevice Solutions our expertise lies in the design and nanofabrication of specialty and regular AFM probes. Currently, our company batch manufactures two probes with unique tips; high aspect ratio (HAR) probes, and edge probes. Learn more about our products and available customizations below for each probe.

High Aspect Ratio (HAR) Tip Probes

Produces high-resolution images that are needed for samples with small openings & deep surface features.

Edge Tip Probes

Specifically designed to aid in finding the exact location of the tip on the desired area on the sample surface. 

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